Markus A., Kecskemeti G, Kertész Attila.
2017. Flexible Representation of IoT Sensors for Cloud Simulators. Proceedings - 2017 25th Euromicro International Conference on Parallel, Distributed and Network-Based Processing, PDP 2017. :199-203.
Page last modified: January 23, 2018
Kecskemeti G, Kertész Attila, Nemeth Z..
2017. Cloud workload prediction by means of simulations. ACM International Conference on Computing Frontiers 2017, CF 2017. :279-282.
Page last modified: January 23, 2018
Vidács L, Horváth F, Tengeri D, Beszédes Á.
2016. Assessing the Test Suite of a Large System Based on Code Coverage, Efficiency and Uniqueness. Proceedings of the IEEE 23rd International Conference on Software Analysis, Evolution, and Reengineering, the First International Workshop on Validating Software Tests (VST'16). :13-16.
Page last modified: January 23, 2018
Vidács L, Horváth F, Mihalicza J, la Vancsics B, Beszédes Á.
2015. Supporting Software Product Line Testing by Optimizing Code Configuration Coverage. Proceedings of the 8th IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW'15); 10th Testing: Academic and Industrial Conference - Practice and Research Techniques (TAIC PART'15). :1-7.
Page last modified: January 23, 2018
Vidács L, Beszédes Á, Tengeri D, Siket István, Gyimóthy T.
2014. Test Suite Reduction for Fault Detection and Localization: A Combined Approach. Proceedings of the CSMR-WCRE 2014 Software Evolution Week - IEEE Conference on Software Maintenance, Reengineering, and Reverse Engineering (CSMR-WCRE'14). :204-213.
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Tengeri D, Vidács L, Beszédes Á, Jász Judit, Balogh G, la Vancsics B, Gyimóthy T.
2016. Relating Code Coverage, Mutation Score and Test Suite Reducibility to Defect Density. Proceedings of the 2016 IEEE International Conference on Software Testing, Verification and Validation Workshops: 11th International Workshop on Mutation Analysis (MUTATION'16). :174-179.
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Siket István, Beszédes Á, Taylor J.
2014. Differences in the Definition and Calculation of the {LOC} Metric in Free Tools.
Page last modified: January 23, 2018
Beszédes Á, Gergely Tamás, Papp I, Marinković V, Zlokolica V, Balogh G, Bognár S, Kastelan I, Kovačević J, Muhi K et al..
2013. Survey on Testing Embedded Systems.
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Tengeri D, Horváth F, Beszédes Á, Gergely Tamás, Gyimóthy T.
2016. Negative Effects of Bytecode Instrumentation on {Java} Source Code Coverage. Proceedings of the IEEE 23rd International Conference on Software Analysis, Evolution, and Reengineering (SANER'16). :225-235.
Page last modified: January 23, 2018
Tengeri D, Beszédes Á, Havas D, Gyimóthy T.
2014. Toolset and Program Repository for Code Coverage-Based Test Suite Analysis and Manipulation. Proceedings of the 14th IEEE International Working Conference on Source Code Analysis and Manipulation (SCAM'14). :47-52.
Page last modified: January 23, 2018
