Title | Relating Code Coverage, Mutation Score and Test Suite Reducibility to Defect Density |
Publication Type | Conference Paper |
Year of Publication | 2016 |
Authors | Tengeri D, Vidács L, Beszédes Á, Jász Judit, Balogh G, la Vancsics B, Gyimóthy T |
Conference Name | Proceedings of the 2016 IEEE International Conference on Software Testing, Verification and Validation Workshops: 11th International Workshop on Mutation Analysis (MUTATION'16) |
Pagination | 174-179 |
Date Published | apr |
Page last modified: January 23, 2018