Paper presented at ICSOFT 2021

July 9, 2021

A paper authored by Dániel Vince, Renáta Hodován, and Ákos Kiss, titled “Reduction-assisted Fault Localization: Don't Throw Away the By-products!” has been accepted for and presented at the ICSOFT conference.

In the article, which was recently presented at the 16th International Conference on Software Technologies (ICSOFT), test case reduction is proposed to assist spectrum-based fault localization (SBFL) in cases where the statistics are unbalanced (such as during fuzz-testing). When using the by-products of test case reduction, the authors increased SBFL’s precision by almost 50% in a real-world use-case.

Page last modified: July 9, 2021