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Filters: First Letter Of Title is S and Author is Vancsics, Béla [Clear All Filters]
Supporting Software Product Line Testing by Optimizing Code Configuration Coverage. Proceedings of the 8th IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW'15); 10th Testing: Academic and Industrial Conference - Practice and Research Techniques (TAIC PART'15). :1-7.. 2015.
Simulating the Effect of Test Flakiness on Fault Localization Effectiveness. Proceedings of the 3rd International Workshop on Validation, Analysis and Evolution of Software Tests (VST'20). :28-35.. 2020.