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Tengeri D, Vidács L, Beszédes Á, Jász Judit, Balogh G, la Vancsics B, Gyimóthy T.  2016.  Relating Code Coverage, Mutation Score and Test Suite Reducibility to Defect Density. Proceedings of the 2016 IEEE International Conference on Software Testing, Verification and Validation Workshops: 11th International Workshop on Mutation Analysis (MUTATION'16). :174-179.