Relating Code Coverage, Mutation Score and Test Suite Reducibility to Defect Density

TitleRelating Code Coverage, Mutation Score and Test Suite Reducibility to Defect Density
Publication TypeConference Paper
Year of Publication2016
AuthorsTengeri D, Vidács L, Beszédes Á, Jász Judit, Balogh G, la Vancsics B, Gyimóthy T
Conference NameProceedings of the 2016 IEEE International Conference on Software Testing, Verification and Validation Workshops: 11th International Workshop on Mutation Analysis (MUTATION'16)
Date Publishedapr